Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors.
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277
Online
academicJournal
Zugriff:
Titel: |
Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors.
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Autor/in / Beteiligte Person: | Le Roch, Alexandre ; Virmontois, Cedric ; Paillet, Philippe ; Warner, Jeffrey H. ; Belloir, Jean-Marc ; Magnan, Pierre ; Goiffon, Vincent |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 67 (2020-02-01), Heft 2, S. 268-277 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2019.2950086 |
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