Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL.
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1861-1868
Online
academicJournal
Zugriff:
Titel: |
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL.
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Autor/in / Beteiligte Person: | Cai, Yulong ; Wen, Lin ; Li, Yudong ; Guo, Qi ; Zhou, Dong ; Feng, Jie ; Zhang, Xiang ; Liu, Bingkai ; Fu, Jing |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1861-1868 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2020.3000275 |
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