A Radiation-Hardened CMOS Image Sensor With Pixels Exhibiting a Negligibly Small Dark-Level Increase During Ionizing Radiation.
In: IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845
Online
academicJournal
Zugriff:
Titel: |
A Radiation-Hardened CMOS Image Sensor With Pixels Exhibiting a Negligibly Small Dark-Level Increase During Ionizing Radiation.
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Autor/in / Beteiligte Person: | Watanabe, Takashi ; Takeuchi, Tomoaki ; Ozawa, Osamu ; Komanome, Hirohisa ; Akahori, Tomoyuki ; Tsuchiya, Kunihiko |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 67 (2020-08-01), Heft 8, S. 1835-1845 |
Veröffentlichung: | 2020 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2020.3003333 |
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