Displacement Damage Characterization of CMOS Single-Photon Avalanche Diodes: Alpha-Particle and Fast-Neutron Measurements.
In: IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 777-784
Online
academicJournal
Zugriff:
Titel: |
Displacement Damage Characterization of CMOS Single-Photon Avalanche Diodes: Alpha-Particle and Fast-Neutron Measurements.
|
---|---|
Autor/in / Beteiligte Person: | Malherbe, Victor ; De Paoli, Serge ; Mamdy, Bastien ; Gasiot, Gilles ; Roche, Philippe |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 68 (2021-05-01), Heft 5, S. 777-784 |
Veröffentlichung: | 2021 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2021.3071171 |
Sonstiges: |
|