Simulation of SEE-Induced Charge Collection in UHV/CVD SiGe HBTs.
In: IEEE Transactions on Nuclear Science, Jg. 47 (2000-12-03), Heft 6, S. 2682-2689
Online
academicJournal
Zugriff:
Titel: |
Simulation of SEE-Induced Charge Collection in UHV/CVD SiGe HBTs.
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Autor/in / Beteiligte Person: | Niu, Guofu ; Cressler, John D. |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 47 (2000-12-03), Heft 6, S. 2682-2689 |
Veröffentlichung: | 2000 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/23.903826 |
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