Proton, Electron, and Heavy Ion Single Event Effects on the HAS2 CMOS Image Sensor.
In: IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1909-1917
Online
academicJournal
Zugriff:
Titel: |
Proton, Electron, and Heavy Ion Single Event Effects on the HAS2 CMOS Image Sensor.
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Autor/in / Beteiligte Person: | Beaumel, Matthieu ; Herve, Dominique ; Van Aken, Dirk ; Pourrouquet, Pierre ; Poizat, Marc |
Link: | |
Zeitschrift: | IEEE Transactions on Nuclear Science, Jg. 61 (2014-08-01), Heft 4, S. 1909-1917 |
Veröffentlichung: | 2014 |
Medientyp: | academicJournal |
ISSN: | 0018-9499 (print) |
DOI: | 10.1109/TNS.2014.2307759 |
Sonstiges: |
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