Evaluation of advanced semiconductor materials by electron microscopy: [proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12 - 17, 1988, in Bristol, United Kingdom]
New York [u.a.]: Plenum Press, 1989
Konferenzschrift, Sammelwerk, Gedruckte Ressource
- XI, 412 S. : Ill., graph. Darst.
Zugriff:
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Titel: |
Evaluation of advanced semiconductor materials by electron microscopy: [proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12 - 17, 1988, in Bristol, United Kingdom]
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Verantwortlichkeitsangabe: | ed. by David Cherns |
Autor/in / Beteiligte Person: | Cherns, David |
Körperschaft: | NATO ; Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy |
Verwandtes Werk: | |
Veröffentlichung: | New York [u.a.]: Plenum Press, 1989 |
Medientyp: | Konferenzschrift, Sammelwerk |
Datenträgertyp: | Gedruckte Ressource |
Umfang: | XI, 412 S. : Ill., graph. Darst. |
ISBN: | 0306433621 |
Schlagwort: |
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