Proceedings of the 1990 International Conference on Microelectronic Test Structures: March 5 - 7, 1990, San Diego, Calif
Piscataway, NJ: Institute of Electrical and Electronics Engineers, 1990
Monographie, Konferenzschrift, Gedruckte Ressource
- X, 244 S. : Ill., graph. Darst., Tab.
Zugriff:
Ermittle Ausleihstatus...
Titel: |
Proceedings of the 1990 International Conference on Microelectronic Test Structures: March 5 - 7, 1990, San Diego, Calif
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Verantwortlichkeitsangabe: | sponsored by the IEEE Electron Devices Society |
Körperschaft: | International Conference on Microelectronic Test Structures, 3, 1990, San Diego, Calif ; International Conference on Microelectronic Test Structures ; IEEE Electron Devices Society |
Veröffentlichung: | Piscataway, NJ: Institute of Electrical and Electronics Engineers, 1990 |
Medientyp: | Monographie, Konferenzschrift |
Datenträgertyp: | Gedruckte Ressource |
Umfang: | X, 244 S. : Ill., graph. Darst., Tab. |
Sonstiges: |
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